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Special IEEE EMC May meeting
May 31, 2017
|Special Guest Speaker:
Presents two Topics:
Life and Time Management:
A short presentation looking back on 75 years of
life, and some suggestions on how to use time and planning to achieve the
goals you select and work toward.
Statistical Process Control (SPC) for an EMC
Measurement system variability in a test
laboratory can be a source of discomfort for the test engineer, the designer
and management. This is especially true in product development
laboratories where the question of exactly what effect a design change had
on system behavior is of central interest. The use of Statistical
Process Control (SPC) methods to gage and track the variability of system
measurements can provide confidence in the repeatability of the system
setup, and in the data it produces.
However, the use of SPC in an EMC Lab,
especially for frequency domain measurements, requires decisions to limit
the quantity of the data to avoid information overload. To accomplish
this careful selection of the measurement methods is essential.
Kimball Williams completed his career and
retired from DENSO as a “Technical Fellow” in 2012 after managing the
DENSO EMC Test Laboratory. He is an iNARTE certified Master EMC Design
Engineer, EMC Test Engineer and ESD Test Engineer with Lifetime
certification from iNARTE.
Kim is also an IEEE Senior Life Member and Past
Chair of the IEEE Southeastern Michigan Section and an ‘Honored Member’
of the IEEE EMC Society where he serves as one of the Past Presidents
Emeritus and current Director of Professional Activities.
Kim is a licensed private pilot, PADDY certified
scuba diver, licensed amateur radio operator (Call sign: N8FNC) and plays
classical guitar in his ‘spare’ time.
The meeting includes a dinner
Wednesday, May 31, 2017
Time: Social Hour:
Society Announcement: 6:30-6:45pm
1250 Peterson Dr.
Wheeling, IL 60090
FREE with registration (below)
Black at 847- 537-6400 or email email@example.com
Meeting is free of charge,
and is open to all interested parties, and not just IEEE members
Chicago IEEE EMC Chapter
Chapter of the Year
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